![]() ![]() ![]() Whether you are looking to invest in your lab, test floor, portfolio or career, we have more information for you here. 90 millimeter ceramic probe card Optimized for multi-site DC parametric test and multi-site WLR Compatible with standard 4. Learn More Sales & ServiceĬontact us today to learn about our products and services, or find a representative in your area to answer your sales and support questions. Follow the link below for a snapshot of some of the industries we support. Learn More IndustriesįormFactor products ensure the quality and reliability of ICs used in electronics affecting every aspect of our lives. Learn More Applicationsįrom the engineering lab to the production test floor, FormFactor’s products enable a wide range of test and measurement applications. From chip-scale to wafer probing systems, cryostats and magnetometry systems to contract test services, our solutions meet the most challenging requirements. Learn More Enabling TechnologyįormFactor offers a range of cryogenic test and measurement solutions to quantum engineers. Learn More Enabling TechnologyįormFactor's FRT metrology engineers designed SurfaceSens technology to achieve superior information about the measured sample and greater insights about product quality. Of engineering probes to meet the highly demanding requirementsĭurable, high-performance that exceeds expectations. FormFactor uses MEMS to build millions of tiny robust electrical springs capable of testing ICs over more than a million contact cycles. MEMS probes are the integral elements of our advanced wafer probe cards. Learn More Enabling TechnologyįormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer - enabling true, autonomous test. Whether you are looking to invest in your lab, test floor, portfolio or career, we have more information for you here.We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership. Learn More Enabling TechnologyįormFactor's FRT metrology engineers designed SurfaceSens technology to achieve superior information about the measured sample and greater insights about product quality. Ultra-fast probes are able to contact points as small as 30 µm and, therefore, they can directly contact the pins of the smallest components on the board: it is no longer necessary to include special test pads in the printed circuit board design. We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership. ![]()
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